Applications of Scanning Electron Microscope and Electron Probe X-ray Microanalyzer to Papers
نویسندگان
چکیده
منابع مشابه
Backscattered electron imaging of cultured cells: application to electron probe X-ray microanalysis using a scanning electron microscope.
We report a simple method to study the elemental content in cultured human adherent cells by electron probe X-ray microanalysis with scanning electron microscopy. Cells were adapted to grow on polycarbonate tissue culture cell inserts, washed with distilled water, plunge-frozen with liquid nitrogen and freeze-dried. Unstained, freeze-dried cultured cells were visualized in the secondary and bac...
متن کاملcellular behavior and scanning electron microscope evaluation of pro-root mta, root mta and modified mta on fibroblast l929
چکیده ندارد.
15 صفحه اولthe scanning electron microscope
it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...
متن کاملX-ray Microanalysis of Cultured Cells in the Scanning Electron Microscope and in the Scanning Transmission Electron Microscope: a Comparison
X-ray microanalysis of cultured cells as “whole mounts” (i.e., not sectioned) is used frequently e.g., to study mechanisms of ion transport. Cells can be cultured either on solid substrates or on thin plastic films on grids. Cells cultured on solid substrates are analyzed in the scanning electron microscope at relatively low accelerating voltage, cells cultured on thin films can be analyzed in ...
متن کاملBarriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy
Low voltage x-ray microanalysis, defined as being performed with an incident beam energy ≤5 keV, can achieve spatial resolution, laterally and in depth, of 100 nm or less, depending on the exact selection of beam energy and the composition of the target. The shallow depth of beam penetration, with the consequent short path length for x-ray absorption, and the low overvoltage, the ratio of beam ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of the Japan Society of Colour Material
سال: 1987
ISSN: 0010-180X
DOI: 10.4011/shikizai1937.60.426